Measurement of High Resistivity Semiconductors Using the van der Pauw Method
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1686224
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1. Cryostat for measuring the electrical properties of high resistance semiconductors at low temperatures
2. The Measurement of a High Impedance Source Having Shunt Capacitance
3. Apparatus for the Measurement of Galvanomagnetic Effects in High Resistance Semiconductors
4. Servo‐Controlled Measuring Bridge for Semiconductors of High Resistivity
5. Charge Transport in Copper Phthalocyanine Single Crystals
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