Design review of an instrument for spectroscopic total integrated light scattering measurements in the visible wavelength region
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1145191
Reference46 articles.
1. The Measurement of Diffuse Reflection Factors and a New Absolute Reflectometer
2. Surface roughness measurements of low-scatter mirrors and roughness standards
3. XXI. The reflective power of lamp- and platinum-black
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