Impact of pulse poling on static and dynamic ferroelastic-domain contributions in tetragonal Pb(Ti, Zr)O3 films determined by in-situ x–ray diffraction analysis-Reference-Cited by-同舟云学术

Impact of pulse poling on static and dynamic ferroelastic-domain contributions in tetragonal Pb(Ti, Zr)O3 films determined by in-situ x–ray diffraction analysis

Published:2014-11-21 Issue:19 Volume:116 Page:194102
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Nakajima Mitsumasa¹²,Wada Ayumi¹,Yamada Tomoaki³⁴,Ehara Yoshitaka¹,Kobayashi Takeshi⁵,Funakubo Hiroshi¹

Affiliation:

1. Department of Innovative and Engineered Material, Tokyo Institute of Technology, Yokohama 226-8503, Japan

2. NTT Device Technology Laboratories, Nippon Telegraph and Telephone, 3-1, Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan

3. Department of Materials, Physics and Energy Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan

4. PRESTO, Japan Science and Technology Agency, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan

5. National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8564, Japan

Funder

CSTP and PRESTO, JST

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4898321

Reference31 articles.

1. Ferroelectric thin films for micro-sensors and actuators: a review

2. Ferroelectric Memories

3. Ferroelectric thin films: Review of materials, properties, and applications

4. Relative coherency strain and phase transformation history in epitaxial ferroelectric thin films

5. Large remanent polarization of 100% polar-axis-oriented epitaxial tetragonal Pb(Zr0.35Ti0.65)O3 thin films

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