In-plane characterization of PZT thin films for the creation of a general impedance model
Author:
Affiliation:
1. Department of Electronics and Information Systems, Ghent University, Technologiepark-Zwijnaarde 126, 9052 Ghent, Belgium
2. Department of Chemistry, Ghent University, Krijgslaan 281—S3, 9000 Ghent, Belgium
Funder
Fonds Wetenschappelijk Onderzoek
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
https://aip.scitation.org/doi/pdf/10.1063/5.0039601
Reference38 articles.
1. Nanophotonic Pockels modulators on a silicon nitride platform
2. Influence of BaTiO_3 ferroelectric orientation for electro-optic modulation on silicon
3. Characteristics of 0.25 µm Ferroelectric Nonvolatile Memory with a Pb(Zr, Ti)O3Capacitor on a Metal/Via-Stacked Plug
4. Ultrathin Ferroelectric Films: Growth, Characterization, Physics and Applications
5. A multilayer thick-film PZT actuator for MEMs applications
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