X-ray diffraction and photoelectron spectroscopic studies of (001)-oriented Pb(Zr0.52Ti0.48)O3 thin films prepared by laser ablation
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1631750
Reference20 articles.
1. Ferroelectric Memories
2. Ferroelectric PbZr0.2Ti0.8O3thin films on epitaxial Y‐Ba‐Cu‐O
3. Growth, characterization, and electrical properties of PbZr0.52Ti0.48O3 thin films on buffered silicon substrates using pulsed laser deposition
4. Effect of substrate material on the crystallinity and epitaxy of Pb(Zr,Ti)O3 thin films
5. Orienting Ferroelectric Films
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