Parametric influence of film thickness and incident angle on resonance spectra of pre- and post-annealed Ga doped ZnO-Reference-Cited by-同舟云学术

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Parametric influence of film thickness and incident angle on resonance spectra of pre- and post-annealed Ga doped ZnO

Published:2019-06-28 Issue:24 Volume:125 Page:243105
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Rajak Sukla¹,Banerjee Jayeta²,Ray Mina²^ORCID

Affiliation:

1. Department of Physics, M.U.C. Women's College, B.C. Road, Burdwan 713104, India

2. Department of Applied Optics and Photonics, University of Calcutta (Technology Campus), Acharya Prafulla Chandra Roy Siksha Prangan, JD-2, Salt Lake, Sec-III, Kolkata 700 106, India

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5096828

Reference33 articles.

1. Searching for better plasmonic materials

2. Optical Measurements of the Surface Plasmon of Indium-Tin Oxide

3. Plasmonic phenomena in indium tin oxide and ITO-Au hybrid films

4. Thickness dependence of surface plasmon polariton dispersion in transparent conducting oxide films at 155 μm

5. Surface plasmon resonance in conducting metal oxides

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Wide Band Gap Al and In Co-doped ZnO Films for Near-Infrared Plasmonic Application;Plasmonics;2021-03-27

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