Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2842631
Reference71 articles.
1. Resistance Minimum in Dilute Magnetic Alloys
2. Imaging Xe with a low-temperature scanning tunneling microscope
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