1. See, for example, articles in theSpreading Resistance Symposium, Gaithersburg, Md., 1974, NBS Spec. Pub. 400-10 edited by J. R. Ehrstein (U.S. GPO, Washington, D.C., 1974).
2. F. H. Pollak, C. E. Okeke, and P. M. Raccah,Proceedings of the Solar Cell High Efficiency and Radiation Damage Meeting, NASA-Lewis, Cleveland, 1977, NASA Conf. Pub. 2020 (NASA, Washington, D.C., 1977), p. 81.
3. C. E. Okeke, Ph.D. thesis, Yeshiva University, 1977.
4. Doping inhomogeneities in semiconductors measured by electroreflectance
5. Doping inhomogeneities in silicon observed by a high-resolution electroreflectance technique