Thin layers and multilayers of porous silicon: X-ray diffraction investigation
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.367438
Reference53 articles.
1. Electrolytic Shaping of Germanium and Silicon
2. Porous silicon: The material and its applications in silicon-on-insulator technologies
3. Silicon quantum wire array fabrication by electrochemical and chemical dissolution of wafers
4. Electroluminescence in the visible range during anodic oxidation of porous silicon films
5. Current-induced light emission from a porous silicon device
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2. X-ray scattering profiles: revealing the porosity gradient in porous silicon;Journal of Applied Crystallography;2021-05-25
3. Structural characterization of porous GaN distributed Bragg reflectors using x-ray diffraction;Journal of Applied Physics;2019-12-07
4. Dynamical Theory of X-Ray Diffraction for Restricted Beams: I. Coherent Scattering by a Porous Crystal;Journal of Experimental and Theoretical Physics;2018-08
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