Comparison of extended x-ray absorption fine structure and Scherrer analysis of x-ray diffraction as methods for determining mean sizes of polydisperse nanoparticles-Reference-Cited by-同舟云学术

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Comparison of extended x-ray absorption fine structure and Scherrer analysis of x-ray diffraction as methods for determining mean sizes of polydisperse nanoparticles

Published:2005-12-05 Issue:23 Volume:87 Page:233102
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Calvin S.,Luo S. X.,Caragianis-Broadbridge C.,McGuinness J. K.,Anderson E.,Lehman A.,Wee K. H.,Morrison S. A.,Kurihara L. K.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.2137872

Reference13 articles.

1. Ultrafine metal particles

2. Nanocrystalline metallic powders and films produced by the polyol method

3. Estimating Crystallite Size in Polydispersed Samples using EXAFS

4. Morphology of supported metal clusters: Determination by EXAFS and chemisorption

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