Interface engineering by constructing vertical junction for reduced noise and improved sensitivity in 2D photodetector

Abstract

Two-dimensional (2D) materials have been widely demonstrated as promising candidates for next generation photodetectors, while the noticeable channel current is still a limiting factor for photodetection sensitivity. In this work, the interface engineering has been developed by constructing a vertical pn and Schottky junction in the 2D WS2 channel, resulting in a reduced dark current and noise spectral density, significantly improving the sensitivity. Specifically, the WS2 bottom surface is coupled with p-type tellurium (Te) nanoribbon and gold (Au) stripes, thus a vertical pn and Schottky junction can be constructed at WS2/Te and WS2/Au interface, respectively. In both device architectures, the dark current and electric noise are much suppressed due to the formation of depletion region in WS2 channel. Meanwhile, the out-of-plane built-in electric field at junction can facilitate the separation of photo-excited electron–hole pairs, which subsequently yields a faster temporal response. For the WS2/Au device, the incident light can be reflected by the bottom Au and propagate through the WS2 layer again, further boosting the photo-absorption, thus the photodetection sensitivity. The engineered WS2 photodetectors exhibit the noise spectral density as low as 5.36 × 10−14 A Hz−1/2 and high specific detectivity (D*) up to 1.12 × 1011 Jones, which has one–two orders of magnitude improvement compared to the pristine device. This work provides an effective and universal interface engineering strategy to achieve low noise and high sensitivity in 2D photodetectors.