High-resolution capacitive load-displacement transducer and its application in nanoindentation and adhesion force measurements
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1878532
Reference14 articles.
1. The measurement of van der Waals dispersion forces in the range 1.5 to 130 nm
2. Atomic Force Microscope
3. An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments
4. J. N. Israelachvili,Intermolecular and Surface Forces, 2nd ed. (Academic, San Diego, 1992), pp. 169, 173–174.
5. Nanoindentation and contact stiffness measurement using force modulation with a capacitive load-displacement transducer
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