Characterization of an active metasurface using terahertz ellipsometry-Reference-Cited by-同舟云学术

Characterization of an active metasurface using terahertz ellipsometry

Published:2017-11-06 Issue:19 Volume:111 Page:191101
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Karl Nicholas¹,Heimbeck Martin S.²,Everitt Henry O.²^ORCID,Chen Hou-Tong³^ORCID,Taylor Antoinette J.³,Brener Igal⁴,Benz Alexander⁴,Reno John L.⁴,Mendis Rajind¹,Mittleman Daniel M.¹^ORCID

Affiliation:

1. School of Engineering, Brown University, 184 Hope St., Providence, Rhode Island 02912, USA

2. U.S. Army AMRDEC, Redstone Arsenal, Huntsville, Alabama 35808, USA

3. Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA

4. Center for Integrated Nanotechnologies, Sandia National Laboratories, Albuquerque, New Mexico 87185, USA

Funder

National Science Foundation

DOD | United States Army | RDECOM | Army Research Office

DOE | LDRD | Sandia National Laboratories

DOE | LDRD | Los Alamos National Laboratory

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/am-pdf/10.1063/1.5004194

Reference26 articles.

1. Towards THz Communications - Status in Research, Standardization and Regulation

2. Advances in terahertz communications accelerated by photonics

3. THz photonic wireless links with 16-QAM modulation in the 375-450 GHz band

4. A 0.28 THz Power-Generation and Beam-Steering Array in CMOS Based on Distributed Active Radiators

5. Terahertz phase modulator

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