Ultrahigh vacuum scanning electron microscope system combined with wide-movable scanning tunneling microscope
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2006388
Reference20 articles.
1. Atomic configuration dependent secondary electron emission from reconstructed silicon surfaces
2. Secondary electron imaging of monolayer steps on a clean Si(111) surface
3. A combined apparatus of scanning reflection electron microscope and scanning tunneling microscope
4. Combination of a Besocke-type scanning tunneling microscope with a scanning electron microscope
5. Design considerations and performance of a combined scanning tunneling and scanning electron microscope
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