NMP limits silver particle size to solve deposited film breakup problems

Abstract

Metal based electroreflective devices (MERDs) have gained wide attention in recent years in the fields of smart windows and automotive glass due to their excellent photo-thermal modulation capability in the visible and near-infrared wavelength bands due to their high reflectivity. However, the high porosity due to the island-like growth of silver particles makes the devices susceptible to electrodeposited film breakage during prolonged energization or bleaching. This will seriously affect the effectiveness and stability of the device. In this paper, it is shown that the problem of Ag electrodeposition film fragmentation can be effectively overcome by replacing dimethyl sulfoxide solvent by N-methylpyrrolidone (NMP). The optical constants during film deposition were tested by the spectroscopic ellipsometry technique, and the porosity was calculated (reduced by 21.6%). The results show that MERDs with NMP as the solvent have more and more dispersed silver deposition sites, which leads to lower porosity of the silver deposited film during the deposition process. In addition, the lower turn-on voltage, greater contrast, longer memory effect, and greater coloring efficiency reveal that they are more promising for energy-saving applications.