Toward nκd spectroscopy: Analytic solution of the three-phase model of polarimetry in the thin-film limit
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2203967
Reference12 articles.
1. Exact ellipsometric measurement of thickness and optical properties of a thin light-absorbing film without auxiliary measurements
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3. Obtaining three surface-film parameters from two ellipsometric measurements
4. Simultaneous real‐time spectroscopic ellipsometry and reflectance for monitoring thin‐film preparation
5. The simultaneous determination of n, k, and t from polarimetric data
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5. Analytic determination of n, κ, and d of an absorbing film from polarimetric data in the thin-film limit;Journal of Applied Physics;2007-02
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