GaAs field‐effect transistor properties, as influenced by the local concentrations of midgap native donors and dislocations
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.96085
Reference12 articles.
1. Electron traps in bulk and epitaxial GaAs crystals
2. Experimental requirements for quantitative mapping of midgap flaw concentration in semi‐insulating GaAs wafers by measurement of near‐infrared transmittance
3. Optical assessment of the main electron trap in bulk semi‐insulating GaAs
4. Direct observation of dislocation effects on threshold voltage of a GaAs field‐effect transistor
5. Threshold voltage scattering of GaAs MESFET's fabricated on LEC-grown semi-insulating substrates
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