Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.125039
Reference11 articles.
1. Minority carrier diffusion length and edge surface‐recombination velocity in InP
2. A Method for the Measurement of Short Minority Carrier Diffusion Lengths in Semiconductors
3. Minority-carrier lifetime and surface recombination velocity measurement by frequency-domain photoluminescence
4. On the analysis of diffusion length measurements by SEM
5. Metal reactivity effects on the surface recombination velocity at InP interfaces
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