Field emission observed from metal-diamond junctions revealed by atomic force microscopy-Reference-Cited by-同舟云学术

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Field emission observed from metal-diamond junctions revealed by atomic force microscopy

Published:2007-06-11 Issue:24 Volume:90 Page:242109
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Furkert S. A.,Wotherspoon A.,Cherns D.,Fox N. A.,Fuge G. M.,Heard P. J.,Lansley S. P.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.2746079

Reference15 articles.

1. Nitrogen containing hydrogenated amorphous carbon for thin‐film field emission cathodes

2. Defect‐enhanced electron field emission from chemical vapor deposited diamond

3. Field emission: New theory for the derivation of emission area from a Fowler–Nordheim plot

4. Mechanism of Field Emission in Diamond and Diamondlike Carbon

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Study of the field emission graphene/SiC nanostructures using scanning probe microscopy;IOP Conference Series: Materials Science and Engineering;2017-10

2. Single mineral particle makes an electron point source;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2015-05

3. Freestanding Ultrananocrystalline Diamond Films with Homojunction Insulating Layer on Conducting Layer and Their High Electron Field Emission Properties;ACS Applied Materials & Interfaces;2011-10-06

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