The study of contact properties in edge-contacted graphene–aluminum Josephson junctions

Author:

Huang Zhujun1,Lotfizadeh Neda2,Elfeky Bassel H.2,Kisslinger Kim3,Cuniberto Edoardo1,Yu Peng2ORCID,Hatefipour Mehdi2,Taniguchi Takashi4ORCID,Watanabe Kenji5ORCID,Shabani Javad2ORCID,Shahrjerdi Davood16ORCID

Affiliation:

1. Electrical and Computer Engineering, New York University, Brooklyn, New York 11201, USA

2. Department of Physics, New York University, New York, New York 10003, USA

3. Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, New York 11973, USA

4. International Center for Materials Nanoarchitectonics, National Institute of Materials Science, 1-1 Namiki Tsukuba, Ibaraki 305-0044, Japan

5. Research Center for Functional Materials, National Institute of Materials Science, 1-1 Namiki Tsukuba, Ibaraki 305-0044, Japan

6. Center for Quantum Phenomena, Department of Physics, New York University, New York, New York 10003, USA

Abstract

Transparent contact interfaces in superconductor–graphene hybrid systems are critical for realizing superconducting quantum applications. Here, we examine the effect of the edge contact fabrication process on the transparency of the superconducting aluminum–graphene junction. We show significant improvement in the transparency of our superconductor–graphene junctions by promoting the chemical component of the edge contact etch process. Our results compare favorably with state-of-the-art graphene Josephson junctions. The findings of our study contribute to advancing the fabrication knowledge of edge-contacted superconductor–graphene junctions.

Funder

National Science Foundation

Army Research Office

Advanced Science Institute

Japan Society for the Promotion of Science

U.S. Department of Energy

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

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