Diffraction Pattern and Structure of Noncrystalline BeF2 and SiO2 at 25°C
Author:
Publisher
AIP Publishing
Subject
Physical and Theoretical Chemistry,General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1677473
Reference12 articles.
1. Absolute Intensity Measurements in Small‐Angle X‐Ray Scattering
2. The Fourier Inversion of Diffraction Data
3. THE STRUCTURE OF SILICA GLASS BY X-RAY DIFFRACTION STUDIES *
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