Exploiting the properties of TiO2 thin films as a sensing layer on (MEMS)-based sensors for radiation dosimetry applications-Reference-Cited by-同舟云学术

Exploiting the properties of TiO2 thin films as a sensing layer on (MEMS)-based sensors for radiation dosimetry applications

Published:2021-02-01 Issue:2 Volume:11 Page:025209
ISSN:2158-3226
Container-title:AIP Advances
language:en
Short-container-title:AIP Advances

Author:

Shamma Khaled¹²³^ORCID,Aldwayyan Abdullah³^ORCID,Albrithen Hamad¹²⁴^ORCID,Alodhayb Abdullah¹²³^ORCID

Affiliation:

1. Research Chair for Tribology, Surface, and Interface Sciences, Department of Physics and Astronomy, College of Science, King Saud University, Riyadh 11451, Saudi Arabia

2. King Abdullah Institute for Nanotechnology, King Saud University, Riyadh 11451, Saudi Arabia

3. Department of Physics and Astronomy, College of Science, King Saud University, Riyadh 11451, Saudi Arabia

4. K.A.CARE Energy Research and Innovation Center at Riyadh, Riyadh 11451, Saudi Arabia

Funder

Deanship of Scientific Research, King Saud University

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/5.0032353

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