Photothermal microscopy: Thermal contrast at grain interface in sintered metallic materials
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.356119
Reference9 articles.
1. Thermal-wave detection and thin-film thickness measurements with laser beam deflection
2. Detection of thermal waves through optical reflectance
3. Photothermal wave imaging of metal‐oxide‐semiconductor field‐effect transistor structures
4. Photothermal imaging of copper‐decorated grain boundary in silicon
5. Temperature field determination of InGaAsP/InP lasers by photothermal microscopy: Evidence for weak nonradiative processes at the facets
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