Enhanced local surface conductivity measurements by scanning tunneling microscopy
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1148250
Reference9 articles.
1. Signal‐to‐noise ratio in lock‐in amplifier synchronous detection: A generalized communications systems approach with applications to frequency, time, and hybrid (rate window) photothermal measurements
2. Lock‐in technique for measuring friction on a nanometer scale
3. Multiple‐channel digital lock‐in amplifier with PPM resolution
4. Scanning tunneling microscope as a probe for local conductivity
5. New method to measure dI/dV and d2I/dV2 of the tunneling current–voltage characteristics
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Frequency dependent Kelvin probe force microscopy on silicon surfaces;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;2009
2. Detecting work-function differences in scanning tunneling microscopy;Applied Physics Letters;1999-05-17
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