Tuning-fork-based fast highly sensitive surface-contact sensor for atomic force microscopy/near-field scanning optical microscopy
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1462038
Reference8 articles.
1. Single fluorescence centers on the tips of crystal needles: First observation and prospects for application in scanning one-atom fluorescence microscopy
2. Nanometer-resolution scanning optical microscope with resonance excitation of the fluorescence of the samples from a single-atom excited center
3. Piezoelectric tip‐sample distance control for near field optical microscopes
4. Piezo-electric tuning fork tip—sample distance control for near field optical microscopes
5. Tuning fork shear-force feedback
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3. A Hydrodynamic Model for Measuring Fluid Density and Viscosity by Using Quartz Tuning Forks;Sensors;2019-12-29
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