A theoretical study on optical field distribution and absorption of stacked thin films supported by a reflective back layer

Author:

Vy Nguyen Duy12ORCID,Pham Vinh N. T.3ORCID,Dat Le Tri45ORCID

Affiliation:

1. Laboratory of Applied Physics, Science and Technology Advanced Institute, Van Lang University 1 , Ho Chi Minh City, Vietnam

2. Faculty of Applied Technology, School of Technology, Van Lang University 2 , Ho Chi Minh City, Vietnam

3. Department of Physics and Postgraduate Office, Ho Chi Minh City University of Education 3 , Ho Chi Minh City, Vietnam

4. Division of Applied Physics, Dong Nai Technology University 4 , Bien Hoa City, Vietnam

5. Faculty of Engineering, Dong Nai Technology University 5 , Bien Hoa City, Vietnam

Abstract

The stacked thin films have recently been of great interest for enhancing the optical and thermal absorption of the system via their specific optical properties depending on the optical wavelength and layer thickness. Here, by using Maxwell’s equation for the electromagnetic fields penetrating thin films, we simulated in detail the absorption of the nanometer-thick thin film of several materials, such as Au, Ag, Cu, and Al, and figured out the optimal thickness range for the outer layers exposed to incoming field to optimize the energy harvesting. In particular, the absorption of the film supported by a totally reflective layer at the back of the structure could be significantly enhanced, and the maximal absorption happens at a layer much thinner than that in the case of the film solely irradiated by the field. These results could help suitably choosing of detailed thickness for the structure to optimize the field effect on a specific layer.

Publisher

AIP Publishing

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