Analysis of plasma-modes of a gated bilayer system in high electron mobility transistors
Author:
Affiliation:
1. Department of Electrical and Computer Engineering, The Ohio State University, Columbus, Ohio 43212, USA
Funder
Office of Naval Research (ONR)
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/am-pdf/10.1063/1.4950795
Reference32 articles.
1. Resonant detection of subterahertz and terahertz radiation by plasma waves in submicron field-effect transistors
2. Resonant and voltage-tunable terahertz detection in InGaAs∕InP nanometer transistors
3. Terahertz photoconductivity and plasmon modes in double-quantum-well field-effect transistors
4. Terahertz emission by plasma waves in 60 nm gate high electron mobility transistors
5. Voltage tuneable terahertz emission from a ballistic nanometer InGaAs∕InAlAs transistor
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Plasmon scattering at a junction in double-layer two-dimensional electron gas plasmonic waveguide;Journal of Physics D: Applied Physics;2024-09-09
2. Acoustic and optical plasmons excitation in double-channel AlGaN/GaN HEMT under asymmetric boundaries;AIP Advances;2024-04-01
3. Study of Two-dimensional Plasmon Resonance of a Grating Gate HEMT;2022 Photonics & Electromagnetics Research Symposium (PIERS);2022-04-25
4. Numerical modeling of highly sensitive resonant detection of THz radiation using a multichannel dispersive plasmonic HEMT;Journal of Computational Electronics;2021-01-19
5. Full wave analysis of terahertz dispersive and lossy plasmonic HEMT using hydrodynamic model;Journal of the Optical Society of America B;2019-03-27
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3