Spatially resolved Fourier transform impedance spectroscopy: A technique to rapidly characterize interfaces, applied to a QD/SiC heterojunction-Reference-Cited by-同舟云学术

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Spatially resolved Fourier transform impedance spectroscopy: A technique to rapidly characterize interfaces, applied to a QD/SiC heterojunction

Published:2021-05-31 Issue:22 Volume:118 Page:223102
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Kelley Mathew L.¹^ORCID,Simin Grigory²,Hussain Kamal²^ORCID,Khan Asif²^ORCID,Greytak Andrew B.¹³^ORCID,Chandrashekhar M. V. S.²^ORCID

Affiliation:

1. Department of Chemistry and Biochemistry, University of South Carolina, Columbia, South Carolina 29208, USA

2. Department of Electrical and Computer Engineering, University of South Carolina, Columbia, South Carolina 29208, USA

3. USC Nanocenter, University of South Carolina, Columbia, South Carolina 29208, USA

Funder

Division of Electrical, Communications and Cyber Systems

Army Research Office

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

https://aip.scitation.org/doi/am-pdf/10.1063/5.0046439

Reference45 articles.

1. Photocurrent Mapping in Single-Crystal Methylammonium Lead Iodide Perovskite Nanostructures

2. Minority Carrier Transport in Lead Sulfide Quantum Dot Photovoltaics

3. Sub-bandgap response of graphene/SiC Schottky emitter bipolar phototransistor examined by scanning photocurrent microscopy

4. Degradation Effects Related to the Hole Transport Layer in Organic Solar Cells

5. Operation Mechanism of Perovskite Quantum Dot Solar Cells Probed by Impedance Spectroscopy

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