A new elliptical-beam method based on time-domain thermoreflectance (TDTR) to measure the in-plane anisotropic thermal conductivity and its comparison with the beam-offset method-Reference-Cited by-同舟云学术

A new elliptical-beam method based on time-domain thermoreflectance (TDTR) to measure the in-plane anisotropic thermal conductivity and its comparison with the beam-offset method

Published:2018-09 Issue:9 Volume:89 Page:094902
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Jiang Puqing¹^ORCID,Qian Xin¹^ORCID,Yang Ronggui¹

Affiliation:

1. Department of Mechanical Engineering, University of Colorado, Boulder, Colorado 80309, USA

Funder

National Science Foundation

U.S. Department of Energy

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/am-pdf/10.1063/1.5029971

Reference46 articles.

1. Black phosphorus field-effect transistors

2. Rediscovering black phosphorus as an anisotropic layered material for optoelectronics and electronics

3. Large In-Plane Anisotropy on Resistivity and Thermopower in the Misfit Layered Oxide Bi2-xPbxSr2Co2Oy

4. Experimental Studies on Anisotropic Thermoelectric Properties and Structures of n-Type Bi2Te2.7Se0.3

5. Superconducting Gap and Strong In-Plane Anisotropy in UntwinnedYBa2Cu3O7−δ

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