Systematic approach for analyzing reflectance-difference spectra: Application to silicon-dielectric interfaces
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2204844
Reference10 articles.
1. Optical characterisation of semiconductor surfaces and interfaces
2. Reflection anisotropy spectroscopy
3. Azimuth-dependent reflection anisotropy spectroscopy
4. G. D. Powell, Ph.D. thesis, North Carolina State University, 2000.
5. Application of reflectance difference spectroscopy to molecular‐beam epitaxy growth of GaAs and AlAs
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