The effect of an electric field on the reaction kinetics of a charge carrier migrating within a one-dimensional chain

Author:

Chetverikov Artem O.12ORCID,Borovkov Vsevolod I.12ORCID

Affiliation:

1. Voevodsky Institute of Chemical Kinetics and Combustion, Siberian Branch of the Russian Academy of Science 1 , 3, Institutskaya St., Novosibirsk 630090, Russia

2. Novosibirsk State University 2 , 2 Pirogova St., Novosibirsk 630090, Russia

Abstract

The aim of this study is to suggest a novel approach for estimating the intramolecular mobility of a charge carrier that migrates within a polymer chain and is involved in a pair reaction with a particle located on the same chain. The approach is based on the effect of an external electric field on the migration rate and, consequently, the kinetics of the reaction. As a first step, this problem is considered a stochastic one-step process with absorbing and reflecting boundaries, and an analytical solution is obtained in the case that the second reactant is immobile. With the use of computer simulations of stochastic migration, the effect of the mobility of both reactants and the influence of the Coulomb interaction between them are considered. It is found that the ratio of the pair reaction rates with and without an external field is relatively little dependent on these factors and that the analytical expressions derived can be applied to estimate the relative mobility of recombining particles with accuracy better than a factor of two in many realistic situations.

Funder

Russian Science Foundation

Publisher

AIP Publishing

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3