Thickness measurement of nontransparent free films by double-side white-light interferometry: Calibration and experiments
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Published:2006-05
Issue:5
Volume:77
Page:055102
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ISSN:0034-6748
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Container-title:Review of Scientific Instruments
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language:en
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Short-container-title:Review of Scientific Instruments
Author:
Poilâne C.,Sandoz P.
Cited by
5 articles.
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