Integrating sphere based reflectance measurements for small-area semiconductor samples-Reference-Cited by-同舟云学术

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Integrating sphere based reflectance measurements for small-area semiconductor samples

Published:2018-05 Issue:5 Volume:89 Page:053101
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Saylan S.¹,Howells C. T.¹,Dahlem M. S.¹

Affiliation:

1. Masdar Institute, Khalifa University of Science and Technology, Abu Dhabi, United Arab Emirates

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5015935

Reference17 articles.

1. Thin-Film InGaAs/GaAsP MQWs Solar Cell With Backside Nanoimprinted Pattern for Light Trapping

2. Towards outperforming conventional sensor arrays with fabricated individual photonic vapour sensors inspired by Morpho butterflies

3. Analysis of Reflectance and Transmittance Measurements on Absorbing and Scattering Small Samples Using a Modified Integrating Sphere Setup

4. Sample holder and methodology for measuring the reflectance and transmittance of narrow-leaf samples

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. High-Precision Surface Scattering Measurement System and Uncertainty Analysis Applied in Laser Protective Materials Diagnostics;Applied Sciences;2021-10-12

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