Morphology induced spectral reflectance lineshapes in VO2 thin films-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Morphology induced spectral reflectance lineshapes in VO2 thin films

Published:2019-06-14 Issue:22 Volume:125 Page:223103
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Ertas Uslu Merve¹²,Yalcin Refet Ali¹^ORCID,Misirlioglu I. Burc¹²³,Sendur Kursat¹²^ORCID

Affiliation:

1. Faculty of Engineering and Natural Sciences, Sabanci University, Orhanli/Tuzla 34956, Istanbul, Turkey

2. Sabanci University Nanotechnology Application Center, Orhanli/Tuzla 34956, Istanbul, Turkey

3. Integrated Manufacturing Technologies Research and Application Center, Sabanci University, Tuzla 34956, Istanbul, Turkey

Funder

Tübitak

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5086272

Reference64 articles.

1. Mechanism and observation of Mott transition in VO2-based two- and three-terminal devices

2. The nature of photoinduced phase transition and metastable states in vanadium dioxide

3. Reversible phase modulation and hydrogen storage in multivalent VO2 epitaxial thin films

4. Hybrid Resonators and Highly Tunable Terahertz Metamaterials Enabled by Vanadium Dioxide (VO2)

5. Oxides Which Show a Metal-to-Insulator Transition at the Neel Temperature

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Examination of energy and visual comfort performance of thermo-chromic coatings for cellular offices;Energy;2023-03

2. Regulation of morphology and structure of vanadium dioxide via a hydrothermal method for optimizing performances;Ceramics International;2022-12

3. Temperature assisted reflection control using VO₂/Si core-shell nanoparticles;Optical Materials Express;2022-07-07

4. A new method to measure spectral reflectance and film thickness using a modified chromatic confocal sensor;Optics and Lasers in Engineering;2022-07

5. Colored radiative cooling coatings with fluorescence;Journal of Photonics for Energy;2021-07-10

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3