Ellipsometric studies of Cd1−xMgxTe (0⩽x⩽0.5) alloys
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.119511
Reference15 articles.
1. Growth of MgTe and Cd1−xMgxTe thin films by molecular beam epitaxy
2. Optical properties of Mg-based II-VI ternaries and quaternaries:Cd1−xMgxTe andCd1−x−yMgxMnyTe
3. Nondestructive analysis of Hg1−xCdxTe (x=0.00, 0.20, 0.29, and 1.00) by spectroscopic ellipsometry. II. Substrate, oxide, and interface properties
4. Ellipsometric studies of electronic interband transitions inCdxHg1−xTe
5. Structural Properties of Cd1-xMgxTe and Cd1-x-yMgxMnyTe Crystals
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