A new method for measuring total electron emission yield of insulators
Author:
Affiliation:
1. School of Microelectronics, Faculty of Electronic and Information Engineering, Xi’an Jiaotong University, Xi’an 710049, China
Funder
National Natural Science Foundation of China
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/5.0011530
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1. Experimental investigations into secondary electron-electron emission from the surface of vacuum chambers
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