Highly reliable and efficient atomic force microscopy based bending test for assessing Young's modulus of one-dimensional nanomaterials-Reference-Cited by-同舟云学术

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Highly reliable and efficient atomic force microscopy based bending test for assessing Young's modulus of one-dimensional nanomaterials

Published:2016-03-21 Issue:12 Volume:108 Page:123104
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Gao Yao¹,Sun Yi-Jing¹,Zhang Tong-Yi²

Affiliation:

1. Department of Mechanical and Aerospace Engineering, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, China

2. Shanghai Materials Genome Institute and Shanghai University Materials Genome Institute, Shanghai University, Shangda Road, Shanghai 200444, China

Funder

Science and Technology Commission of Shanghai Municipality (STCSM)

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4944726

Reference34 articles.

1. Functional Nanowires

2. Giant piezoresistance effect in silicon nanowires

3. Super-tough carbon-nanotube fibres

4. Nanomechanical resonators and their applications in biological/chemical detection: Nanomechanics principles

5. High-frequency micromechanical resonators from aluminium–carbon nanotube nanolaminates

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