Low angle x‐ray reflection study of ultrathin Ge films on (100) Si
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.104055
Reference8 articles.
1. Ge‐Si layered structures: Artificial crystals and complex cell ordered superlattices
2. RBS/Channelinc and Tem Analysis of Thin Sandwiched EPI-Layers of Germanium on Silicon
3. Monolayer resolution by means of x‐ray interference in semiconductor heterostructures
4. Surface Studies of Solids by Total Reflection of X-Rays
5. Observation of X-ray interferences on thin films of amorphous silicon
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