A novel wireless sample temperature control system for field ion, field electron, and atom probe techniques
Author:
Affiliation:
1. Institute of Materials Chemistry, TU Wien, 1060 Vienna, Austria
Funder
Austrian Science Fund
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5126185
Reference50 articles.
1. FIELD ION MICROSCOPY
2. Atom-Probe Field Ion Microscopy
3. The Atom‐Probe Field Ion Microscope
4. Atom Probe Tomography
5. Three-Dimensional Atom-Probe Tomography: Advances and Applications
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