Synthesis and characterization of XeAr2 under high pressure

Author:

Wang Mengnan1ORCID,Kuzovnikov Mikhail A.1ORCID,Binns Jack2ORCID,Li Xiaofeng3,Peña-Alvarez Miriam1ORCID,Hermann Andreas1ORCID,Gregoryanz Eugene124ORCID,Howie Ross T.12ORCID

Affiliation:

1. Centre for Science at Extreme Conditions and School of Physics and Astronomy, University of Edinburgh 1 , Edinburgh, United Kingdom

2. Center for High Pressure Science and Technology Advanced Research 2 , Shanghai, China

3. College of Physics and Electronic Information, Luoyang Normal University 3 , Luoyang, China

4. Key Laboratory of Materials Physics, Institute of Solid State Physics, CAS 4 , Hefei, China

Abstract

The binary Xe–Ar system has been studied in a series of high pressure diamond anvil cell experiments up to 60 GPa at 300 K. In-situ x-ray powder diffraction and Raman spectroscopy indicate the formation of a van der Waals compound, XeAr2, at above 3.5 GPa. Powder x-ray diffraction analysis demonstrates that XeAr2 adopts a Laves MgZn2-type structure with space group P63/mmc and cell parameters a = 6.595 Å and c = 10.716 Å at 4 GPa. Density functional theory calculations support the structure determination, with agreement between experimental and calculated Raman spectra. Our DFT calculations suggest that XeAr2 would remain stable without a structural transformation or decomposition into elemental Xe and Ar up to at least 80 GPa.

Funder

HORIZON EUROPE European Research Council

UK Research and Innovation

Publisher

AIP Publishing

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

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