Laser monitor for non-destructive testing of materials and processes shielded by intensive background lighting-Reference-Cited by-同舟云学术

Laser monitor for non-destructive testing of materials and processes shielded by intensive background lighting

Published:2014-03 Issue:3 Volume:85 Page:033111
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Evtushenko G. S.,Trigub M. V.,Gubarev F. A.,Evtushenko T. G.,Torgaev S. N.,Shiyanov D. V.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4869155

Reference23 articles.

1. Laser machining of objects with simultaneous visual monitoring in a copper vapor oscillator-amplifier system

2. Use of a laser medium in photography of a surface shielded by a plasma layer

3. F. B. J. Buchkremer, A. J. Andrews, D. W. Coutts, and C. E. Webb, Technical Digest of Papers Presented at the Thirteenth UK National Quantum Electronics Conference, University of Wales, Cardiff, 8–11 September 1997 (Institute of Physics, 1997), p. 116.

4. On the possibility of studying the temporal evolution of a surface relief directly during exposure to high-power radiation

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