Separating interface state response from parasitic effects in conductance measurements on organic metal-insulator-semiconductor capacitors
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2844435
Reference17 articles.
1. The Si-SiO2Interface - Electrical Properties as Determined by the Metal-Insulator-Silicon Conductance Technique
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3. Interface states in polymer metal-insulator-semiconductor devices
4. Interfacial charge phenomena at the semiconductor/gate insulator interface in organic field effect transistors
5. Excimer-laser micropatterned photobleaching as a means of isolating polymer electronic devices
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