Field-free magnetic switching dependence on lateral interfaces in synthetic antiferromagnets by ion implantation

Author:

Shen Bowen12ORCID,Yang Meiyin12ORCID,Li Yanru12ORCID,Yu Peiyue12,Gao Jianfeng1,Cui Baoshan345,Yu Guoqiang34ORCID,Luo Jun12ORCID

Affiliation:

1. Key Laboratory of Microelectronic Devices and Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences (IMECAS) 1 , Beijing 100029, China

2. University of Chinese Academy of Sciences (UCAS) 2 , Beijing 100049, China

3. Songshan Lake Materials Laboratory 3 , Dongguan, Guangdong 523808, China

4. Institute of Physics, Chinese Academy of Sciences 4 , Beijing 100190, China

5. Key Laboratory for Magnetism and Magnetic Materials of Ministry of Education, Lanzhou University 5 , Lanzhou 730000, China

Abstract

Field-free spin–orbit torque switching in synthetic antiferromagnets (SAF) holds significant promise for high-density spintronic memory and logic devices. In this paper, we realize the field-free magnetization switching in SAFs due to the local ion implantation-induced 45° lateral interface and symmetry breaking. Moreover, the magnetization switching ratio is enlarged by the lateral interface owing to the superimposition of a damping-like effective field and a symmetry-breaking effective field. Our work is significant for the development of magnetic random-access memory technology with high-speed and anti-interference ability.

Funder

Institute of Microelectronics of the Chinese Academy of Sciences

Youth Innovation Promotion Association

Beijing Nova Program

Publisher

AIP Publishing

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