A method to retrieve optical and geometrical characteristics of three layer waveguides from m-lines measurements
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2885147
Reference19 articles.
1. A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin film
2. Determination of optical parameters in general film–substrate systems: a reformulation based on the concepts of envelope extremes and local magnitudes
3. Theory of Prism–Film Coupler and Thin-Film Light Guides
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