The present status of the Tokyo electron beam ion trap-Reference-Cited by-同舟云学术

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The present status of the Tokyo electron beam ion trap

Published:1998-02 Issue:2 Volume:69 Page:694-696
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Nakamura N.,Asada J.,Currell F. J.,Fukami T.,Hirayama T.,Kato D.,Motohashi K.,Nojikawa E.,Ohtani S.,Okazaki K.,Sakurai M.,Shimizu H.,Tada N.,Tsurubuchi S.,Watanabe H.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1148555

Reference18 articles.

1. Measurement of electron-impact–excitation cross sections for very highly charged ions

2. Determination of the number of ions in the Oxford electron beam ion trap

3. Overview of the electron beam ion trap program at NIST

4. First results from the Berlin EBIT

5. A high-energy electron beam ion trap for production of high-charge high-Z ions

Cited by 25 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Activities at the Tokyo EBIT 2010;Journal of Instrumentation;2010-08-18

2. Dielectronic recombination in He-like, Li-like, and Be-like highly charged ions in theKLLandKLMmanifolds;Physical Review A;2010-02-17

3. Spectroscopy with trapped highly charged ions;Physica Scripta;2009-05

4. Recent activities at the Tokyo EBIT 2006;Canadian Journal of Physics;2008-01-01

5. A “brief” history of spectroscopy on EBIT;Canadian Journal of Physics;2008-01-01

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