Defect structure induced during forward‐bias degradation of GaP green‐light‐emitting diodes-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Defect structure induced during forward‐bias degradation of GaP green‐light‐emitting diodes

Published:1976-04 Issue:4 Volume:47 Page:1583-1588
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:

Author:

Petroff P. M.¹,Lorimor O. G.¹,Ralston J. M.¹

Affiliation:

1. Bell Laboratories, Murray Hill, New Jersey 07974

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Reference21 articles.

1. R. L. Hartman, B. Schwartz, and M. Kuhn, Appl. Phys. Lett. 18, 304 (1971).APPLAB0003-6951

2. J. M. Ralston and O. G. Lor1mor (unpublished).

3. J. M. Ralston (unpublished).

4. H. Schade, C. J. Nuese, and J. J. Gannon, J. Appl. Phys. 42, 5072 (1971).JAPIAU0021-8979

5. R. L. Longini, Solid‐State Electron. 5, 127 (1962).SSELA50038-1101

Cited by 62 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Clustering of oxygen point defects in transition metal nitrides;Journal of Applied Physics;2021-02-07

2. Development of semiconducting ScN;Physical Review Materials;2019-02-14

3. Degradation of Se-Doped GaAs0.6P0.4Light-Emitting Diodes;Japanese Journal of Applied Physics;2002-02-15

4. X-ray induced photoemission of a localized electron and its application to site-selective x-ray absorption fine structure measurement;Journal of Applied Physics;2000

5. Degradation of commercial high-brightness GaP:N green light emitting diodes;Journal of Applied Physics;1998-06-15

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP