Express analysis of the dependence of the superconducting film critical temperature on its thickness
Author:
Affiliation:
1. National University of Science and Technology MISIS
2. National University of Science and Technology MISIS; Kotelnikov Institute of Radio engineering and Electronics of Russian Academy of Sciences
Publisher
FSUE VNIIMS All-Russian Research Institute of Metrological Service
Subject
General Medicine
Reference12 articles.
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2. Gao J., Ph. D thesis (Physics), California Institute of Technology, 2008.
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4. Lee S. F., Gildemeister J. M., Holmes W., Lee A. T. and Richards P. L., Appl. Opt., 1998, vol. 37, pp. 3391–3397. DOI: 10.1364/AO.37.003391
5. Irwin K. D. and Hilton G. C., Topics Appl. Phys., 2005, vol. 99, pp. 63–149.
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