Measurement of 100 nm and 60 nm Particle Standards by Differential Mobility Analysis-Reference-Cited by-同舟云学术

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Measurement of 100 nm and 60 nm Particle Standards by Differential Mobility Analysis

Published:2006-07 Issue:4 Volume:111 Page:257
ISSN:1044-677X
Container-title:Journal of Research of the National Institute of Standards and Technology
language:
Short-container-title:J. Res. Natl. Inst. Stand. Technol.

Author:

Mulholland George W.,Donnelly Michelle K.,Hagwood Charles R.,Kukuck Scott R.,Hackley Vincent A.,Pui David Y. H.

Publisher

National Institute of Standards and Technology (NIST)

Subject

General Engineering

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