Affiliation:
1. National Institute of Standards and Technology, Physical Measurement
Laboratory, Gaithersburg, MD 20899, USA
2. National Institute of Standards and Technology, Engineering Laboratory,
Gaithersburg, MD 20899, USA
Abstract
X-ray computed tomography (XCT), long used in medical imaging and defect
inspection, is now increasingly used for dimensional measurements of geometrical
features in engineering components. With widespread use of XCT instruments, there is
growing need for the development of standardized test procedures to verify
manufacturer specifications and provide pathways to establish metrological
traceability. As technical committees within the American Society of Mechanical
Engineers (ASME) and the International Organization for Standardization (ISO) are
developing documentary standards that include test procedures that are sensitive to
all known error sources, we report on work exploring one set of error sources,
instrument geometry errors, and their effect on dimensional measurements. In
particular, we studied detector and rotation stage errors in cone-beam XCT
instruments and determined their influence on sphere center-to-center distance
errors and sphere form errors for spheres located in the tomographically
reconstructed measurement volume. We developed a novel method, called the
single-point ray tracing method, that allows for efficient determination of the
sphere center-to-center distance error and sphere form error in the presence of each
of the different geometry errors in an XCT instrument. In Part I of this work, we
(1) describe the single-point ray tracing method, (2) discuss optimal placement of
spheres so that sphere center-to-center distance errors and sphere form errors are
sensitive to the different detector geometry errors, and (3) present data validating
our method against the more conventional radiograph-based tomographic reconstruction
method. In Part II of this work, we discuss optimal placement of spheres so that
sphere center-to-center distance errors and sphere form errors are sensitive to
error sources associated with the rotation stage. This work is in support of ongoing
standards development activity within ASME and ISO for XCT performance
evaluation.
Publisher
National Institute of Standards and Technology (NIST)
Reference14 articles.
1. Computed tomography for dimensional metrology
2. X-ray computed tomography for additive manufacturing: a review
3. Dimensional measurement traceability of 3D imaging data
4. American Society of Mechanical Engineers (2006) ASME
B89.7.5-2006—Metrological traceability of dimensional measurements to the SI
unit of length (ASME, New York).
5. The Association of German Engineers (2011) VDI/VDE
2617-13—Guideline for the application of DIN EN ISO 10360 for coordinate
measuring machines with CT sensors (Association of German Engineers, Düsseldorf,
Germany).
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14 articles.
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