Application of GRID to foreign atom localization in single crystals
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Published:2000-01
Issue:1
Volume:105
Page:177
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ISSN:1044-677X
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Container-title:Journal of Research of the National Institute of Standards and Technology
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language:
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Short-container-title:J. Res. Natl. Inst. Stand. Technol.
Author:
Karmann A.,Wesch W.,Weber B.,Borner H.G.,Jentschel M.
Publisher
National Institute of Standards and Technology (NIST)
Subject
General Engineering